Dennis Callahan
Graduate Student, Materials Science

Transmission Electron Microscope (TEM) image, modified with scientific image analysis software ImageJ. The original micrograph is of a sample of molybdenum trioxide (MoO3) crystals and impurities on a holey carbon grid, taken at 120keV accelerating voltage and 37,500x magnification. The image was taken on a Philips EM420 TEM in the Materials Science Department.

callahan@caltech.edu