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Kenneth Diest
Graduate Student, Material Science

Scanning electron microscope image of iron oxide crystallites. The iron adhered to samples during a series of wet etching and film growth steps at elevated temperatures. Subsequent imaging of the processed samples showed multiple structures such as this that had grown on the etched side walls of a silicon wafer. The long axis of the crystallite is approximately 400 microns.tion

diest@caltech.edu

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